Luisa Ottolini (born July 10, 1954 in Tortona, province of Alessandria, Italy) is an Italian physicist.
Her research activities are concerned mainly with the development, set up and optimisation of microanalytical procedures for the quantitative determination of elements present at low concentrations (trace), light (Lithium, Beryllium and Boron) and volatile elements (Hydrogen, Fluorine, Chlorine, Carbon) in samples of mineralogical, petrologic and geochemical interest.
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In 1978 Luisa Ottolini graduated in Physics at the University of Pavia.
From 1982 to 1986 she was the Head of the Structuristic Section at the Istituto Sperimentale dei Metalli Leggeri (I.S.M.L.) in Novara.
In 1987 she activated the Strategic Project of the National Research Council of Italy (CNR) An Ion Microprobe for Advanced Researches in the Earth Sciences with the installation at the “Centro di Studio per la Cristallografia Strutturale” in Pavia of the first, and so far, the only one National Laboratory of Secondary Ion Mass Spectrometry (SIMS) in the Earth Sciences. Since that time she has been the Head of the SIMS Lab.
Starting from 1989 she activated the National SIMS service for University and CNR Institutions affering the Earth Science Committee (05), following more than 90 research projects.
In 2002-2005 she coordinated a research Unit in Pavia, sponsored by the European Framework Project EUROMELT[1] (European Community’s Human Potential Programme, contract HPRN-CT-2002-00211).
Since December, 19 (2005) she has been the Head of CNR-Institute of Geosciences and Geo-resources (IGG)-Section of Pavia.
She is coauthor of more than 120 international ISI publications, of which 5 on Nature; more than 200 Abstracts at International and National Meetings, 35 monographs and inner reports.
Investigation of the physical/chemical processes underlying the production of secondary ions in the SIMS technique. Aim at overcoming the limitations of the technique in the quantitative analysis of geological samples: corrections for interferences and non-linear effects (“matrix effects”).
Development and optimization of SIMS procedures for the quantitative analysis of trace elements: Rare earth element, Scandium, Titanium, Vanadium, Chromium, Strontium, Zirconium, Yttrium, Barium, Cesium, Niobium, Rubidium, Hafnium, Uranium, Thorium; light and volatile elements: Lithium, Beryllium, Boron, Hydrogen, Fluorine, Chlorine, Carbon, and ultra-trace elements (ppb level) in the frame of petrologic, geochemical and crystal-chemical studies, with particular reference to the investigation of: